{"product_id":"ieej-20240512b00901-006","title":"国際標準に準じたプロセスバスに関する異ベンダ装置間の相互接続性試験","description":"\u003cp\u003e\u003cstrong\u003eカテゴリ: \u003c\/strong\u003e研究会(論文単位)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e論文No: \u003c\/strong\u003ePPR24006\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eグループ名: \u003c\/strong\u003e【B】電力・エネルギー部門 保護リレ－システム研究会\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e発行日: \u003c\/strong\u003e2024\/05\/12\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eタイトル(英語): \u003c\/strong\u003eMultivendor Interconnectivity Tests for Process Bus based on International Standards\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e著者名: \u003c\/strong\u003e川崎 航太(電力中央研究所),出口 真行(電力中央研究所),岡井 誠(東芝エネルギーシステムズ),大嶋 静二(東芝エネルギーシステムズ),下藤 圭悟(日立製作所),城井 翔太郎(日立製作所),片柳 康孝(三菱電機),岩丸 明史(三菱電機),長田 恵一(富士電機),石上 雄太(富士電機)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e著者名(英語): \u003c\/strong\u003eKota Kawasaki(Central Research Institute of Electric Power Industry),Masayuki Deguchi(Central Research Institute of Electric Power Industry),Makoto Okai(Toshiba Energy Systems \u0026amp; Solutions Corporation),Seiji Oshima(Toshiba Energy Systems \u0026amp; Solutions Corporation),Keigo Shimofuji(Hitachi, Ltd),Shotaro Shiroi(Hitachi, Ltd),Yasutaka Katayanagi(Mitsubishi Electric Corporation),Akifumi Iwamaru(Mitsubishi Electric Corporation),Keiichi Nagata(Fuji Electric Co., Ltd),Yuta Ishigami(Fuji Electric Co., Ltd)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eキーワード: \u003c\/strong\u003e国際規格|変電所|プロセスバス|ＩＥＤ|ＭＵ|マルチベンダ|International standard|substation|process bus|IED|MU|Multivendor\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e要約(日本語): \u003c\/strong\u003e現時点で入手可能な国内外のIED4台，MU6台を用いて，IEC 61850等に準じたプロセスバスに関する異ベンダ装置間の相互接続性試験を実施した。SVメッセージの試験，保護制御機能において基本となる計測・遮断器制御・監視・事故除去の機能試験を通じて，課題を特定し，国内における共通的な適用方法として定めるべき仕様を検討した。\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e要約(英語): \u003c\/strong\u003eThe process bus for signal transmission between intelligent electronic device (IED) and merging unit (MU) has been proposed. To implement the process bus in substations effectively, it is essential to establish common specifications based on international standards such as IEC 61850 and IEC 61869 to ensure interoperability but there could be problems caused by the variation of interpretation and implementation in various vendors. Therefore, this paper conducts multivendor interconnectivity tests related to the process bus including four IEDs and six MUs from Japan and overseas that are currently available. Tests focus on Sampled Value (SV) messages from MUs, involving a comparison of current and voltage waveforms extracted from SV messages, as well as verification of SV message reading in each IED. In addition, functional tests are conducted for essential substation functions including measurement, circuit breaker control, monitoring, and protection. This paper considers common methods and specifications to fix the problems identified throughout interconnectivity tests.\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e本誌: \u003c\/strong\u003e\u003ca href=\"\/products\/ieej-20240512b00901\"\u003e2024年5月15日保護リレ－システム研究会\u003c\/a\u003e\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e本誌掲載ページ: \u003c\/strong\u003e31-36 p\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e原稿種別: \u003c\/strong\u003e日本語\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003ePDFファイルサイズ: \u003c\/strong\u003e641 Kバイト\u003c\/p\u003e","brand":"IEEJ-P10","offers":[{"title":"冊子印刷（一般価格660円\/会員価格440円） \/ A4 \/ 6","offer_id":46352569860335,"sku":"IEEJ-20240512B00901-006-PRT","price":660.0,"currency_code":"JPY","in_stock":true},{"title":"PDFダウンロード（一般価格330円\/会員価格220円） \/ A4 \/ 6","offer_id":46355727057135,"sku":"IEEJ-20240512B00901-006-PDF","price":330.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0718\/9512\/2159\/files\/IEEJ-KENKYUKAI_cd076fc5-f993-4ea1-9feb-c2eb382a2483.png?v=1743252277","url":"https:\/\/ieej.bookpark.ne.jp\/products\/ieej-20240512b00901-006","provider":"電気学会 電子図書館","version":"1.0","type":"link"}