{"product_id":"ieej-20250120x10201-017","title":"Modelling and Analysis of Zero-Sequence Current in Power Electronics Mission Profile Emulator for Photovoltaic Application","description":"\u003cp\u003e\u003cstrong\u003eカテゴリ: \u003c\/strong\u003e研究会(論文単位)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e論文No: \u003c\/strong\u003eSPC25018,MD25018\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eグループ名: \u003c\/strong\u003e【D】産業応用部門 半導体電力変換\/【D】産業応用部門 モータドライブ合同研究会\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e発行日: \u003c\/strong\u003e2025\/01\/20\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eタイトル(英語): \u003c\/strong\u003eModelling and Analysis of Zero-Sequence Current in Power Electronics Mission Profile Emulator for Photovoltaic Application\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e著者名: \u003c\/strong\u003eZhu Wenjie(Shanghai Jiao Tong University),Xia Shihao(Shanghai Jiao Tong University),Ma Ke(Shanghai Jiao Tong University)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e著者名(英語): \u003c\/strong\u003eWenjie Zhu(Shanghai Jiao Tong University),Shihao Xia(Shanghai Jiao Tong University),Ke Ma(Shanghai Jiao Tong University)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eキーワード: \u003c\/strong\u003eMission profile emulation|testing|reliability|Zero-sequence current|Photovoltaic|Mission profile emulation|testing|reliability|Zero-sequence current|Photovoltaic\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e要約(日本語): \u003c\/strong\u003eAs the wide integration of photovoltaic (PV) power generation in modern power grids, reliability of PV converters is becoming crucial, and there is an urgent need for comprehensive testing before the PV converters are put into field operation. Due to comp\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e要約(英語): \u003c\/strong\u003eAs the wide integration of photovoltaic (PV) power generation in modern power grids, reliability of PV converters is becoming crucial, and there is an urgent need for comprehensive testing before the PV converters are put into field operation. Due to complex mission profiles, significant challenges have been experienced to the reliability testing of power electronics. A mission profile emulation (MPE) system, involving a three-level neutral-point-clamped (NPC) converter and a two-level converter through face-to-face connection, is proposed as a promising method for new approaches of converter testing, offering programmable mission profiles, improved testing efficiency and reduced testing costs. Typically, in order to reduce power loss, the DC links of two converters in MPE system are connected to achieve power circulation, which inevitably creates zero-sequence current, as can be classified as high-frequency zero-sequence ripples and low-order zero-sequence harmonics, and will further result in current distortions. However, in terms of MPE system with different converter topologies and mismatched carriers, mechanism of zero-sequence current excitation remains unclear, and the potential sampling distortions and control errors have seldomly been studied. In this paper, the mathematical model of zero-sequence current in the MPE system with different converter topologies and mismatched carriers is established. Impacts of the zero-sequence current, including waveform distortions, sampling distortions and control errors, are also discussed in details. Simulation in PLECS and experiment on a prototype are carried out to validate the analysis.\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e本誌: \u003c\/strong\u003e\u003ca href=\"\/products\/ieej-20250120x10201\"\u003e2025年1月23日-2025年1月24日半導体電力変換\/モータドライブ合同研究会-1\u003c\/a\u003e\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e本誌掲載ページ: \u003c\/strong\u003e99-107 p\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e原稿種別: \u003c\/strong\u003e英語\u003c\/p\u003e","brand":"IEEJ-P10","offers":[{"title":"冊子印刷（一般価格660円\/会員価格440円） \/ A4 \/ 9","offer_id":46408127054063,"sku":"IEEJ-20250120X10201-017-PRT","price":660.0,"currency_code":"JPY","in_stock":true},{"title":"PDFダウンロード（一般価格330円\/会員価格220円） \/ A4 \/ 9","offer_id":46408555495663,"sku":"IEEJ-20250120X10201-017-PDF","price":330.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0718\/9512\/2159\/files\/IEEJ-KENKYUKAI_a1273e62-ec09-4192-8cf7-5561664484a9.png?v=1745232671","url":"https:\/\/ieej.bookpark.ne.jp\/products\/ieej-20250120x10201-017","provider":"電気学会 電子図書館","version":"1.0","type":"link"}