{"product_id":"ieej-sp06030","title":"Recent Developments on High Current Measurement Using Current Shunt","description":"\u003cp\u003e\u003cstrong\u003eカテゴリ: \u003c\/strong\u003e研究会(論文単位)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e論文No: \u003c\/strong\u003eSP06030\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eグループ名: \u003c\/strong\u003e【B】電力・エネルギー部門　開閉保護研究会\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e発行日: \u003c\/strong\u003e2006\/11\/14\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eタイトル(英語): \u003c\/strong\u003eRecent Developments on High Current Measurement Using Current Shunt\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e著者名: \u003c\/strong\u003eTatsuo Kawamura(University of Tokyo),Eiichi Haginomori(Chuo University),Yutaka Goda(CRIEPI),Tetsuya Nakamoto(Toshiba Corporation)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e著者名(英語): \u003c\/strong\u003eTatsuo Kawamura(University of Tokyo),Eiichi Haginomori(Chuo University),Yutaka Goda(CRIEPI),Tetsuya Nakamoto(Toshiba Corporation)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eキーワード: \u003c\/strong\u003emeasurement|standard|short-circuit test|high power|traceability|measurement|standard|short-circuit test|high power|traceability\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e原稿種別: \u003c\/strong\u003e日本語\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003ePDFファイルサイズ: \u003c\/strong\u003e842 Kバイト\u003c\/p\u003e","brand":"IEEJ-PDF","offers":[{"title":"PDFダウンロード（一般価格330円\/会員価格220円） \/ A4 \/ 9","offer_id":46368065126639,"sku":"IEEJ-SP06030-PDF","price":330.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0718\/9512\/2159\/files\/IEEJ-PDF_296ba934-d11d-4697-9f1d-116d5176567d.png?v=1743824502","url":"https:\/\/ieej.bookpark.ne.jp\/products\/ieej-sp06030","provider":"電気学会 電子図書館","version":"1.0","type":"link"}