{"product_id":"ieej-sp07065","title":"Relation Between Surface Roughness and Number of Cathode Spots","description":"\u003cp\u003e\u003cstrong\u003eカテゴリ: \u003c\/strong\u003e研究会(論文単位)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e論文No: \u003c\/strong\u003eSP07065\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eグループ名: \u003c\/strong\u003e【B】電力・エネルギー部門　開閉保護研究会\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e発行日: \u003c\/strong\u003e2007\/07\/09\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eタイトル(英語): \u003c\/strong\u003eRelation Between Surface Roughness and Number of Cathode Spots\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e著者名: \u003c\/strong\u003eAtsushi Sato(Musashi Institute of Technology),Toru Iwao(Musashi Institute of Technology),Motoshige Yumoto(Musashi Institute of Technology)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e著者名(英語): \u003c\/strong\u003eAtsushi Sato(Musashi Institute of Technology),Toru Iwao(Musashi Institute of Technology),Motoshige Yumoto(Musashi Institute of Technology)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eキーワード: \u003c\/strong\u003eCathode spot|Low pressure arc|Oxide layer|Image processing|Cathode spot|Low pressure arc|Oxide layer|Image processing\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e原稿種別: \u003c\/strong\u003e日本語\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003ePDFファイルサイズ: \u003c\/strong\u003e678 Kバイト\u003c\/p\u003e","brand":"IEEJ-PDF","offers":[{"title":"PDFダウンロード（一般価格330円\/会員価格220円） \/ A4 \/ 7","offer_id":46368166248687,"sku":"IEEJ-SP07065-PDF","price":330.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0718\/9512\/2159\/files\/IEEJ-PDF_80a16ff4-042e-48bb-ae8c-2e1aa71235ce.png?v=1743826979","url":"https:\/\/ieej.bookpark.ne.jp\/products\/ieej-sp07065","provider":"電気学会 電子図書館","version":"1.0","type":"link"}