{"product_id":"ieej-zt194007","title":"Investigation of Unclamped Inductive Switching Capability of Silicon Carbide MOSFETs","description":"\u003cp\u003e\u003cstrong\u003eカテゴリ: \u003c\/strong\u003e全国大会\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e論文No: \u003c\/strong\u003e4-007\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eグループ名: \u003c\/strong\u003e【全国大会】平成31年電気学会全国大会論文集\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e発行日: \u003c\/strong\u003e2019\/03\/01\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eタイトル(英語): \u003c\/strong\u003eInvestigation of Unclamped Inductive Switching Capability of Silicon Carbide MOSFETs\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e著者名: \u003c\/strong\u003eKailun Yao(University of Tsukuba),Hiroshi Yano(University of Tsukuba),Noriyuki Iwamuro(University of Tsukuba)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e著者名(英語): \u003c\/strong\u003eKAILUN YAO(University of Tsukuba),Hiroshi Yano(University of Tsukuba),Noriyuki Iwamuro(University of Tsukuba)\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003eキーワード: \u003c\/strong\u003eSiC MOSFET,破壊耐量,p-ch MOSFET\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e要約(日本語): \u003c\/strong\u003eUIS capability of n-ch and p-ch SiC MOSFETs is investigated. The single pulse UIS failure of n-ch MOSFET is cause by melting of the surface metal heating during the avalanche time. The thermal introduced failure is not the reason that causes the UIS failure of p-ch MOSFET. The UIS failure mechanism of p-ch MOSFET is unclear and needs to deeply study.The repetitive UIS of p-ch MOSFET is studied experimentally and numerically. Measurement shows no obvious electrical degradations. Simulation shows that the electrical stress of channel region during UIS is low, which can give a reasonable explanation of no obvious degradation.\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003e原稿種別: \u003c\/strong\u003e英語\u003c\/p\u003e\u003cp\u003e\u003cstrong\u003ePDFファイルサイズ: \u003c\/strong\u003e688 Kバイト\u003c\/p\u003e","brand":"IEEJ-PDF","offers":[{"title":"PDFダウンロード（一般価格440円\/会員価格220円） \/ A4 \/ 2","offer_id":46401742733551,"sku":"IEEJ-ZT194007-PDF","price":440.0,"currency_code":"JPY","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0718\/9512\/2159\/files\/IEEJ-PDF_e989fcc5-c4f5-4604-98a0-39233f326341.png?v=1744953692","url":"https:\/\/ieej.bookpark.ne.jp\/products\/ieej-zt194007","provider":"電気学会 電子図書館","version":"1.0","type":"link"}