DSPとIGBTを用いた半導体型限流器の動作確認試験

カテゴリ: 部門大会

論文No: 38

グループ名: 【B】平成15年電気学会電力・エネルギー部門大会講演論文集

発行日: 2003/08/06

タイトル(英語): Semiconducting-type Fault Current Limiter using Digital Signal Processor and IGBT

著者名: 雪田 和人(愛知工業大学),荒川 貴政(愛知工業大学),神谷 高志(愛知工業大学),山田 浩(愛知工業大学),後藤 泰之(愛知工業大学),一柳 勝宏(愛知工業大学),松村 年郎(名古屋大学)

著者名(英語): Kazuto Yukita(Aichi Institute of Technology),Takamasa Arakawa(Aichi Institute of Technology),Takashi Kamiya(Aichi Institute of Technology),Hiroshi Yamada(Aichi Institute of Technology),Yasuyuki Goto(Aichi Institute of Technology),Katsuhiro Ichiyanagi(Aichi Institute of Technology),Toshiro Matsumura(Nagoya University)

キーワード: 半導体型限流器|DSP|IGBT|PSCAD|小規模実験|Semiconducting-type Fault Current Limiter |DSP|IGBT|PSCAD|test equipment of small capacity

要約(日本語): This paper proposes a new semiconducting-type fault current limiter (FCL) using the digital signal processor (DSP) to improve the instantaneous voltage drop and to reduce the fault current of power system. The proposed FCL used a insulated gate bipolar transistor (IGBT) as a commutation element. Next, the DSP is used in proposed FCL in order to detect the fault current at high speed. The DSP used in this paper is TMS320C67. This is mainly used by the real-time processing, and it is suitable for the high-speed operation. The examination was carried out using computer simulation and test equipment of small capacity in order to demonstrate the effectiveness of the proposal technique.

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