Improvement of Dielectric Strength as Microstructural Enhancement of XLPE Insulation
Improvement of Dielectric Strength as Microstructural Enhancement of XLPE Insulation
カテゴリ: 部門大会
論文No: 109
グループ名: 【B】平成18年電気学会電力・エネルギー部門大会講演論文集
発行日: 2006/09/13
タイトル(英語): Improvement of Dielectric Strength as Microstructural Enhancement of XLPE Insulation
著者名: Sang-Jin Lee (LS電線),Sung-Ik Shim (LS電線),Jong-Soo Kim (LS電線),In-Ho Lee (LS電線)
著者名(英語): Sang-Jin Lee(LS Cable Ltd),Sung-Ik Shim(LS Cable Ltd),Jong-Soo Kim(LS Cable Ltd),In-Ho Lee(LS Cable Ltd)
キーワード: Additives breakdown strength|Semiconductive breakdown strength|XLPE Power cable
要約(日本語): With the aim of developing a XLPE insulation for extra high voltage cable, we investigated the morphology of cross-linked polyethylene. We used two kind of base materials and additives, and controlled curing condition and amount of additives. The effect of addition of additives on morphology of XLPE such as lamellar density, orientation and additive layer were analyzed using TEM analysis and synchrotron. For breakdown strength of XLPE insulation with additives and base materials, the mold-type XLPE specimens were made and evaluated with Weibull plot parameters, and compared with morphological characteristics. We apply this result to manufactured model cable and this model cable was found to have superior dielectric strength due to excellent morphological characteristics.
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