Measurement of ionization coefficients in HFO-1336mzz(E)

カテゴリ: 部門大会

論文No: 2-B-p2-2

グループ名: 【A】令和3年電気学会基礎・材料・共通部門大会

発行日: 2021/09/01

著者名: Yuki Hasukawa(Muroran I.T, ), Kazushi Satoh(Muroran I.T, ), Kazuhiro Takahashi(Muroran I.T, ), Kohki Satoh(Muroran I.T, ), Ryoko Sasahara(Mitsubishi Electric Corp.）, Manabu Yoshimura(Mitsubishi Electric Corp.）

キーワード: ionization coefficient|electron attachment|Steady-State Townsend|HFO-1336mzz?

要約(日本語): Pre-breakdown ionization current I(d) of HFO-1336mzz(E) is measured by the Steady-State Townsend (SST) method, and the ionization α, the electron attachment η,and the secondary ionization γ coefficients are deduced. It is found that the limiting E/N of HFO-1336mzz(E) is at approximately 410 Td, and that the value is 1.16 times as high as that of SF6. It is also found that (α-η)/N/ in HFO-1336mzz(E) has minimum value around 300 Td and tends to be nought though (α-η)/N in SF6 monotonously decrease when E/N decreases.

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