【English Poster Presentation (YPCE)】Observation of changes in partial discharge activity in artificial voids under long-term voltage application

カテゴリ: 部門大会

論文No: 7-P1-A-5

グループ名: 【A】令和5年電気学会基礎・材料・共通部門大会

発行日: 2023/08/24

著者名: Takato Sakakihara(Mie University)，Yusuke Aoki(Mie University)，Kazuo Ida(Mie University)，Tokihiro Umemura(Mie University)，Masahiro Kozako(Kyushu Institute of Technology University)，Masayuki Hikita(Kyushu Institute of Technology University)，Daiki Ito(Toshib

キーワード: Partial discharge phenomenon|Electrical insulating mateials

要約(日本語): It is known that the cause of insulation degradation in high-voltage equipment is partial discharge originating from defects in the resin or resin composite contained in the insulation system. To understand the degradation state of the resin due to exposure to partial discharge within defects, we have visualized the discharge region using transparent electrodes in the electrode-resin-electrode system containing defects and investigated the correlation with the Φ-q-n characteristic. In this study, we report the results of our attempt to understand the changes in the degradation process of insulators during long-term voltage application by examining the q-Φn characteristics, discharge region inside the void, and discharge traces on the sample surface after testing in sample structures that simulate sealed and open voids.

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