Determining Reflectance Properties of Metallic Surface Using ICA

カテゴリ: 部門大会

論文No: TC14-3

グループ名: 【C】平成22年電気学会電子・情報・システム部門大会講演論文集

発行日: 2010/09/02

タイトル(英語): Determining Reflectance Properties of Metallic Surface Using ICA

著者名: 諏訪 正樹(オムロン),庄 沱(オムロン),Zhou Zeng(上海交通大学),LiZuang Ma(上海交通大学)

著者名(英語): Masaki Suwa(OMRON Corporation),Tou Sho(OMRON Corporation),Zhou Zeng(Shanghai Jiao Tong University),Lizuang Ma(Shanghai Jiao Tong University)

キーワード: BRDF計測|独立成分分析|表面粗さ表面粗さ|BRDF measurement|Independent component Analysis|surface roughness

要約(日本語): Generally, BRDF models use specular albedo, diffuse albedo and surface roughness as the main reflectance properties. Most BRDF measurement approaches require delicate instruments and complex measuring processes for obtaining geometrical information of viewer, light source and surface. In this paper, we propose a novel approach to evaluate specular and diffuse albedos by applying the Independent Component Analysis (ICA) and new BRDF measurement system. Surface roughness is evaluated as a relative value using separated supecular images. The proposed method does not require any geometrical information and is very suitable for metallic surface.

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