Self improvement of comparator element value by Q-Learning in consideration of corner analysis

カテゴリ: 部門大会

論文No: SS1-5

グループ名: 【C】2019年電気学会電子・情報・システム部門大会プログラム

発行日: 2019/08/28

タイトル(英語): Self improvement of comparator element value by Q-Learning in consideration of corner analysis

著者名: 猿田 将大(群馬大学),髙井 伸和(群馬大学),今野 哲史(群馬大学)

著者名(英語): Masahiro Saruta|Nobukazu Takai|Satosi Konno

キーワード: Q-Learning|自動設計|コンパレータ|アナログ回路|Q-Learning|Automatic design|Comparator|Analog circuit

要約(日本語): Comparators are utilized for ADC parts in IC, and high-speed and low-power consumption comparators are required. However, to realize their characteristics is difficult. Then, we proposed the comparator design by utilizing Q-Learning. To further improve the accuracy of this method, we need to consider corner analysis because circuit characteristics vary by the corner of MOSFET process. Therefore, we propose the decision of an element value by utilizing Q-Learning in consideration of corner analysis. We succeeded in the automatic design of high-speed and low-power consumption comparator while considering of corner analysis in the target circuit.

PDFファイルサイズ: 276 Kバイト