High-Density Double-Layer Printed Circuit Board Inspection by Using　High-Frequency Eddy-Current Probe

カテゴリ: 部門大会

論文No: 2-36

グループ名: 【D】平成17年電気学会産業応用部門大会講演論文集

発行日: 2005/08/29

著者名: Komkrit Chomsuwan (金沢大学),山田外史 (金沢大学),岩原正吉 (金沢大学),脇若弘之 (信州大学),庄司茂 (TDK)

キーワード: eddy-current|spin-valve giant magnetoresistance|high-density double-layer printed circuit board|microdefect

要約(日本語): High-frequency eddy-current probe for high-density double-layer PCB inspection is proposed.Meander exciting coil with the SV-GMR sensor is used for this proposed.The proposed ECT probe construction and its characteristics are proposed.The proposed ECT pro

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