Equivalence Between Nyquist and Routh-Hurwitz Stability Criteria for Operational Amplifier Design

カテゴリ: 研究会(論文単位)

論文No: ECT17043

グループ名: 【C】電子・情報・システム部門 電子回路研究会

発行日: 2017/03/10

タイトル(英語): Equivalence Between Nyquist and Routh-Hurwitz Stability Criteria for Operational Amplifier Design

著者名: 王 建龍(群馬大学),Adhikari Gopal(群馬大学),築地 伸和(群馬大学),平野 繭(群馬大学),小林 春夫(群馬大学),栗原 圭汰(群馬大学),長浜 顕仁(リコー電子デバイス),野田 一平(リコー電子デバイス),吉井 宏治(リコー電子デバイス)

著者名(英語): JianLong Wang(Gunma University),Gopal Adhikari(Gunma University),Nobukazu Tsukiji(Gunma University),Mayu Hirano(Gunma University),Haruo Kobayashi(Gunma University),Keita Kurihara(Gunma University),Akihito Nagahama(Ricoh Electronic Devices Co.Ltd),Ippei Noda(Ricoh Electronic Devices Co.Ltd),Kohji Yoshii(Ricoh Electronic Devices Co.Ltd)

キーワード: オペアンプ|安定性|ナイキスト安定判別|ラウス－フルビッツ安定判別|ボーデ線図|利得／位相余裕|Operational Amplifier|Stability|Nyquist Stability Criterion|Routh-Hurwitz Stability Criterion|Bode Chart|Gain/Phase Margin

要約(日本語): Equivalence Between Nyquist and Routh-Hurwitz Stability Criteria for Operational Amplifier Design. Theoretical part, respective mathematical foundations of Nyquist and Routh-Hurwitz stability criteria have been deduced, and the mathematical foundations are equivalent. Experiments verification part, relatively satisfactory results can be obtained, corresponding simulation results can be showed by LTspice simulater at transistor level circuit.

要約(英語): Equivalence Between Nyquist and Routh-Hurwitz Stability Criteria for Operational Amplifier Design. Theoretical part, respective mathematical foundations of Nyquist and Routh-Hurwitz stability criteria have been deduced, and the mathematical foundations are equivalent. Experiments verification part, relatively satisfactory results can be obtained, corresponding simulation results can be showed by LTspice simulater at transistor level circuit.

原稿種別: 英語

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