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Influence of short-duration arc on contact erosion and contact resistance in hybrid DC switch

Influence of short-duration arc on contact erosion and contact resistance in hybrid DC switch

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カテゴリ: 研究会(論文単位)

論文No: ED18053

グループ名: 【A】基礎・材料・共通部門 放電研究会

発行日: 2018/06/04

タイトル(英語): Influence of short-duration arc on contact erosion and contact resistance in hybrid DC switch

著者名: Ou Chomrong(Tokyo Institute of Technology School of Engineering),Tian Xinhao(Tokyo Institute of Technology School of Engineering),Nakayama Ryo(Tokyo Institute of Technology School of Engineering),Yasuoka Koichi(Tokyo Institute of Technology School of Engineering)

著者名(英語): Chomrong Ou(Tokyo Institute of Technology School of Engineering),Xinhao Tian(Tokyo Institute of Technology School of Engineering),Ryo Nakayama(Tokyo Institute of Technology School of Engineering),Koichi Yasuoka(Tokyo Institute of Technology School of Engineering)

キーワード: Hybrid DC switch|Short-duration arc|Contact erosion|Contact resistance|Spectrum|Hybrid DC switch|Short-duration arc|Contact erosion|Contact resistance|Spectrum

要約(日本語): Contact erosion due to an arc discharge is a critical problem particularly for a DC switch or a DC circuit breaker. This work presents influence the arc on contact erosion and resistance in opening and closing contacts in the hybrid DC switch. In opening or closing contacts, a short-duration arc occurred between the contacts and commutated the circuit current from the contacts to the SiC-MOSFET until it extinguished. The arc voltage and current waveforms together with spectrum from the arc were measured. The contact erosion and resistance were examined to clarify the effect of the short-duration arc.

要約(英語): Contact erosion due to an arc discharge is a critical problem particularly for a DC switch or a DC circuit breaker. This work presents influence the arc on contact erosion and resistance in opening and closing contacts in the hybrid DC switch. In opening or closing contacts, a short-duration arc occurred between the contacts and commutated the circuit current from the contacts to the SiC-MOSFET until it extinguished. The arc voltage and current waveforms together with spectrum from the arc were measured. The contact erosion and resistance were examined to clarify the effect of the short-duration arc.

原稿種別: 英語

PDFファイルサイズ: 2,179 Kバイト

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