航空機用パワー半導体の宇宙線故障率解析

カテゴリ: 研究会(論文単位)

論文No: EDD20069,SPC20219

グループ名: 【C】電子・情報・システム部門 電子デバイス/【D】産業応用部門 半導体電力変換合同研究会

発行日: 2020/12/21

タイトル(英語): Cosmic Ray Failure Rate Calculation for Power Semiconductor Device for Aircraft applications

著者名: Gollapudi Srikanth(九州工業大学),大村 一郎(九州工業大学)

著者名(英語): Srikanth Gollapudi(Kyushu Institute of technology),Ichiro Omura(Kyushu Institute of technology)

要約(日本語): The electric power usage in aircraft has reached 1MW and demands the high power semiconductor devices for avionics. Single Event Burnout (SEB) failure occurs when power devices operating in blocking condition interact with cosmic radiation. Devices operat

要約(英語): The electric power usage in aircraft has reached 1MW and demands the high power semiconductor devices for avionics. Single Event Burnout (SEB) failure occurs when power devices operating in blocking condition interact with cosmic radiation. Devices operating at airplane altitude are more susceptible to failure because the cosmic neutron flux increases with altitude and reaches maximum at airplane altitude. _x000D_ Conventional methods such as Zeller approach for failure rate calculation cannot be applicable for airplane altitude. We proposed a methodology to calculate the failure rate for any radiation condition by decoupling the failure cross section and the neutron flux spectrum._x000D_ _x000D_ _x000D_

原稿種別: 英語

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