Analysis of scanning near-field optical microscopy with simple models

カテゴリ: 研究会(論文単位)

論文No: EMT10148

グループ名: 【A】基礎・材料・共通部門 電磁界理論研究会

発行日: 2010/11/12

タイトル(英語): Analysis of scanning near-field optical microscopy with simple models

著者名: NGUYEN TIEN DONG (岐阜大学),田中 雅宏(岐阜大学),田中 嘉津夫(岐阜大学)

著者名(英語): NGUYEN TIEN DONG (Gifu University),Tanaka Masahiro(Gifu University),Tanaka Kazuo(Gifu University)

キーワード: scanning near-field optical microscopy|simple model|near-field|far-field|analytical method|sphere

要約(日本語): We use the analytical method to study the electromagnetic scattering in scanning near-field optical microscopy (SNOM) models. In these models, the probe tip is approximated to a sphere while the sample is approximated to a group of spheres with various size. With this analytical method, we are able to analyze the physical mechanism of the interaction between the probe tip and the sample in SNOM intuitively.

要約(英語): We use the analytical method to study the electromagnetic scattering in scanning near-field optical microscopy (SNOM) models. In these models, the probe tip is approximated to a sphere while the sample is approximated to a group of spheres with various size. With this analytical method, we are able to analyze the physical mechanism of the interaction between the probe tip and the sample in SNOM intuitively.

原稿種別: 日本語

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