Study on ESD Phenomena of Magnetic Head by 1ns Pulse ESD

カテゴリ: 論文誌(論文単位)

グループ名: 【A】基礎・材料・共通部門

発行日: 2011/11/01

タイトル(英語): Study on ESD Phenomena of Magnetic Head by 1ns Pulse ESD

著者名: Takayoshi Ohtsu (Suzuka National College of Technology), Kouji Kataoka (Hitachi Global Storage Technologies Japan, Ltd.)

著者名(英語): Takayoshi Ohtsu (Suzuka National College of Technology), Kouji Kataoka (Hitachi Global Storage Technologies Japan, Ltd.)

キーワード: ESD，EMI，GMR head，damage

要約(英語): Magnetic Recording heads, the most electrostatic discharge (ESD/EOS) sensitive device of all electric devices, are used for high density magnetic recording applications. Recently, as the devices become increasingly smaller, there has arisen a concern for damaging GMR (Giant Magneto Resistive) heads by EMI. Also, CDM or nano second pulse ESD is key issue for Magnetic head manufacturing. In order to study the effect of ESD (Electro Static Discharge) with nano pulse width for GMR heads, transfer curves of GMR heads using high field QST (Quasi Static Tester) were investigated. By applying ESD damage to GMR head, the transfer curves change the waveforms. Also, there are many kinds of waveforms of transfer curves for after ESD damaged heads. It was found that the degradation of pinned layer was caused by nano pulse ESD and the phenomena were detected by high field QST.

本誌: 電気学会論文誌A（基礎・材料・共通部門誌） Vol.131 No.11 （2011）

本誌掲載ページ: 938-942 p

原稿種別: 論文／英語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejfms/131/11/131_11_938/_article/-char/ja/