静電気試験器の微小ギャップを介した接触放電に対する放電電流の増大現象と等価回路による機構解明

カテゴリ: 論文誌(論文単位)

グループ名: 【A】基礎・材料・共通部門

発行日: 2016/06/01

タイトル(英語): Enhancement Phenomena and Mechanism Elucidation from Equivalent Circuit for Discharge Current through Small Gap in Contact Discharge of Electrostatic Generator

著者名: 石田　武志（（株）ノイズ研究所／電気通信大学），肖　鳳超（電気通信大学），上　芳夫（電気通信大学），藤原　修（電気通信大学），仁田　周一（（株）ノイズ研究所）

著者名(英語): Takeshi Ishida (Noise Laboratory Co., LTD./University of Electro-communications), Fengchao Xiao (University of Electro-communications), Yoshio Kami (University of Electro-communications), Osamu Fujiwara (University of Electro-communications), Shuichi Nitta (Noise Laboratory Co., LTD.)

キーワード: 静電気放電試験，接触放電，微小ギャップ，放電電流，増大現象，等価回路　　electrostatic discharge test，contact discharge，small gap，discharge current，enhancement phenomena，equivalent circuit

要約(英語): In electrostatic discharge (ESD) immunity tests specified by the international electrotechnical commission (IEC), it has been learned empirically that a contact discharge test sometimes provides a severe test result even under the same test level. This is said to be due to the existence of small air gaps between an ESD generator and equipment under test. To clarify the phenomena, we previously measured discharge currents through small air gaps from 30 µm to 1000 µm in contact discharges of an ESD generator to an IEC current calibration target, which revealed that multiple current peaks appear depending on the gap length and test voltage as well. It was also demonstrated that the contact discharge current with a small gap provides a faster rise time and larger current peak in comparison with normal contact discharge tests even at the same test voltage. In this study, to explain these findings quantitatively, we proposed a simplified circuit model combined with a spark-resistance formula which allows one to analyze the discharge currents through the above-mentioned air gaps in 8 kV contact discharge tests. As a result, we found that the calculated waveforms in contact discharges with/without a gap fairly agree with the measured results. It was also found that the proposed circuit provides roughly the same dependence of current peaks on a gap length as the measured results.

本誌: 電気学会論文誌A（基礎・材料・共通部門誌） Vol.136 No.6 （2016） 特集：広帯域電磁界の電子機器および通信に対する障害

本誌掲載ページ: 341-346 p

原稿種別: 論文／日本語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejfms/136/6/136_341/_article/-char/ja/