暗号回路におけるサイドチャネル情報漏洩挙動の内部電流源による分析

カテゴリ: 論文誌(論文単位)

グループ名: 【A】基礎・材料・共通部門

発行日: 2016/06/01

タイトル(英語): Analysis of Side-channel Information Leaking Behavior in Cryptographic Circuit using Internal Current Source

著者名: 五百旗頭　健吾（岡山大学大学院自然科学研究科），田井　伸拓（岡山大学大学院自然科学研究科），籠谷　裕人（岡山大学大学院自然科学研究科），大西　紘之（岡山大学大学院自然科学研究科），豊田　啓孝（岡山大学大学院自然科学研究科），渡辺　哲史（岡山県工業技術センター）

著者名(英語): Kengo Iokibe (Graduate School of Natural Science and Technology, Okayama University), Nobuhiro Tai (Graduate School of Natural Science and Technology, Okayama University), Hiroto Kagotani (Graduate School of Natural Science and Technology, Okayama University), Hiroyuki Onishi (Graduate School of Natural Science and Technology, Okayama University), Yoshitaka Toyota (Graduate School of Natural Science and Technology, Okayama University), Tetsushi Watanabe (Industrial Technology Center of Okayama Prefecture)

キーワード: 暗号セキュリティ，サイドチャネル攻撃，相関電力解析，EMC，等価回路，スイッチング電流　　cryptographic security，side-channel attack，correlation power analysis，electromagnetic compatibility，equivalent circuit，switching current

要約(英語): Cryptographic circuits were analyzed regarding their side-channel information leaking behavior based on internal current source. Cryptographic circuits were implemented in an FPGA with registers arranged to demonstrate three known side-channel information leaking behaviors; (1) leakage is reduced by making Hamming distance (HD) at registers constant, (2) leakage increases with signal-to-noise ratio of side-channel traces, and (3) unbalance of routing path from registers to load circuits produces leakage. The implemented circuits were measured in terms of voltage fluctuation in the power distribution network for FPGA core circuit where the circuits were implemented. The measured voltage fluctuations were converted into internal current sources that were exploited to analyze the information leaking behavior by applying a side-channel analysis, correlation power analysis (CPA). The analysis confirmed that internal current source clearly demonstrated the side-channel information leaking behaviors. This results suggests that internal current source would allow to understand what parts of encryption circuits largely contribute to leak information and how to develop an efficient and low-cost countermeasure against side-channel attacks.

本誌: 電気学会論文誌A（基礎・材料・共通部門誌） Vol.136 No.6 （2016） 特集：広帯域電磁界の電子機器および通信に対する障害

本誌掲載ページ: 365-371 p

原稿種別: 論文／日本語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejfms/136/6/136_365/_article/-char/ja/