意図的な電磁妨害時にハードウェアトロイによって引き起こされる情報漏えい評価

カテゴリ: 論文誌(論文単位)

グループ名: 【A】基礎・材料・共通部門

発行日: 2017/03/01

タイトル(英語): Evaluation of EM Information Leakage caused by IEMI with Hardware Trojan

著者名: 衣川　昌宏（仙台高等専門学校情報ネットワーク工学科），林　優一（東北学院大学工学部），森　達哉（早稲田大学基幹理工学部情報通信学科）

著者名(英語): Masahiro Kinugawa (Department of Information Networks, National Institute of Technology, Sendai College), Yu-ichi Hayashi (Faculty of Engineering, Tohoku Gakuin University), Tatsuya Mori (Communication Engineering Department, Waseda University)

キーワード: 電磁妨害，電磁情報漏洩，ハードウェアトロイ　　intentional electromagnetic interference，electromagnetic information leakage，Hardware Trojans

要約(英語): Hardware Trojans (HT) that are implemented at the time of manufacturing ICs are being reported as a new threat that could destroy the IC or degrade its security under specific circumstances, and is becoming a key security challenge that must be addressed. On the other hand, since it is also common to use components manufactured or bought via third parties in portions outside of the substrate on which the IC is mounted or communication lines connecting the IC and the substrate, there is a possibility that HTs may also be set in the peripheral circuits of the IC in the same manner as in the IC. In this paper, we developed an HT that could be implemented in the peripheral circuits and wiring of an IC, investigated the possibility of being able to acquire information processed inside a device by measuring the electromagnetic waves generated and leaked by Intentional Electromagnetic Interference (IEMI) with HT outside the device, and investigated detection methods for cases where such HTs are implemented.

本誌: 電気学会論文誌A（基礎・材料・共通部門誌） Vol.137 No.3 （2017）

本誌掲載ページ: 153-157 p

原稿種別: 論文／日本語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejfms/137/3/137_153/_article/-char/ja/