等価回路解析に基づく結晶シリコン系太陽電池モジュールの出力低下要因の推定
等価回路解析に基づく結晶シリコン系太陽電池モジュールの出力低下要因の推定
カテゴリ: 論文誌(論文単位)
グループ名: 【B】電力・エネルギー部門
発行日: 2013/06/01
タイトル(英語): Presumption of Lowering Factor of Power in Crystalline Silicon PV Modules Based on Equivalent Circuit Analysis
著者名: 林 健太郎(同志社大学理工学部),高橋 康人(同志社大学理工学部),藤原 耕二(同志社大学理工学部),石原 好之(同志社大学理工学部),増田 幸治((財)電気安全環境研究所),加藤 宏((財)電気安全環境研究所)
著者名(英語): Kentaro Hayashi (Faculty of Science and Engineering, Doshisha University), Yasuhito Takahashi (Faculty of Science and Engineering, Doshisha University), Koji Fujiwara (Faculty of Science and Engineering, Doshisha University), Yoshiyuki Ishihara (Faculty of Science and Engineering, Doshisha University), Kohji Masuda (Japan Electrical Safety & Environment Technology Laboratories), Hiroshi Kato (Japan Electrical Safety & Environment Technology Laboratories)
キーワード: 太陽電池モジュール,経年劣化,屋外暴露試験,等価回路パラメータ PV module,aged deterioration,field test,solar cell parameter
要約(英語): In this paper, based on the data of field exposure test, which was initiated by Japan Electrical Safety & Environment Technology Laboratories (JET), we investigate the degradation characteristics of crystalline silicon PV modules by using its equivalent circuit model for the purpose of the lifetime extension in the development of PV modules. Specifically, we observe the degradation of bus bar electrode and solar cell by capturing electro luminescence images and infrared images of the surface of PV modules when forward voltage is applied. Although this observation enables us to determine which part of the PV module deteriorates, it is impossible to quantitatively evaluate how much each deteriorated component has an influence on power degradation. Accordingly, using the equivalent circuit model of the PV module, we calculate the equivalent circuit parameters from the measured I-V characteristics of the PV modules in the field exposure test by the least squares method. We adopt the photocurrent, series resistance, shunt resistance and diode factor as unknown parameters in the equivalent circuit model. Based on the change of the circuit parameters, we evaluate the influence of the deterioration of each component on decline of output power quantitatively.
本誌: 電気学会論文誌B(電力・エネルギー部門誌) Vol.133 No.6 (2013) 特集:電力インフラと電気自動車の融合
本誌掲載ページ: 541-547 p
原稿種別: 論文/日本語
電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejpes/133/6/133_541/_article/-char/ja/
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