測定ブリッジ4辺のC分に対応した新CST方式動ひずみ測定器
測定ブリッジ4辺のC分に対応した新CST方式動ひずみ測定器
カテゴリ: 論文誌(論文単位)
グループ名: 【C】電子・情報・システム部門
発行日: 2011/08/01
タイトル(英語): A Proposal of New CST Method for Carrier Type Dynamic Strain Amplifier with C Component on 4 Arms of Bridge
著者名: 久保寺 眞司((株) 共和電業),丹沢 勉(山梨大学大学院医学工学総合研究部),清弘 智昭(山梨大学大学院医学工学総合研究部)
著者名(英語): Shinji Kubodera (Kyowa Electronic Instrument Co. Ltd.), Tsutomu Tanzawa (Graduate School of Medicine and Engineering, University of Yamanashi), Noriaki Kiyohiro (Graduate School of Medicine and Engineering, University of Yamanashi)
キーワード: ひずみゲージ,搬送波型動ひずみ測定器,2点帰還容量分自動追尾,測定ブリッジ4辺のC分に対応 strain gage,carrier type dynamic strain amplifier,Dual Feedback CST method,bridge for measuring 4 arms with capacitance
要約(英語): Carrier type dynamic strain amplifiers are frequently used for stress measurement with strain gages. That is because the carrier type dynamic strain amplifier can conduct high precision measurement since it is highly resistant to external noise or power noise in the field. The strain gage has little effect on specimen being measured since it is small and light weight. However it is required to connect the input cable from the target strain gage to the amplifier. In case of using the carrier type dynamic amplifier, distributed capacitance due to the input cable greatly effects zero point variation.The distributed capacitance changing degrades the stability of the dynamic strain amplifier.We made up and logically clarify Dual Feedback CST (Capacitance Self Tracing) method that detects, self-tracks and eliminates the capacitive component generated in any arm of the measuring bridge. The zero-point variation is not affected by the carrier frequency and resistance value and can be cancelled if the bridge is balanced in the CST method.We conducted experiments with strain gage resistance 120 ohm or 350 ohm and carrier frequency 5 kHz, 12 kHz or 28 kHz and verified the zero-point stability.
本誌: 電気学会論文誌C(電子・情報・システム部門誌) Vol.131 No.8 (2011)
本誌掲載ページ: 1445-1450 p
原稿種別: 論文/日本語
電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejeiss/131/8/131_8_1445/_article/-char/ja/
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