A Three-dimensional Shape Measurement Method Requiring only a Single Observation Image Based on Pattern Projection Technique
A Three-dimensional Shape Measurement Method Requiring only a Single Observation Image Based on Pattern Projection Technique
カテゴリ: 論文誌(論文単位)
グループ名: 【C】電子・情報・システム部門
発行日: 2011/12/01
タイトル(英語): A Three-dimensional Shape Measurement Method Requiring only a Single Observation Image Based on Pattern Projection Technique
著者名: Ke Sun (Fukuoka Institute of Technology), Cunwei Lu (Fukuoka Institute of Technology)
著者名(英語): Ke Sun (Fukuoka Institute of Technology), Cunwei Lu (Fukuoka Institute of Technology)
キーワード: three-dimensional shape measurement,optimal intensity-modulation pattern projection
要約(英語): We have developed a three-dimensional shape measurement technique using the optimal intensity-modulation pattern projection method that provides three-dimensional information from a single pattern projection. The practical use of the technique is expected in the near future. However, when the color distribution and surface reflections of the target are complex, to cancel their influence, it is necessary to use another observation image as a reference to correct the intensity of the observed pattern. In this study, we propose an analysis method with an original color system and image correction technology to realize three-dimensional measurement using only one observation image.
本誌: 電気学会論文誌C(電子・情報・システム部門誌) Vol.131 No.12 (2011) 特集:電気関係学会東海支部連合大会
本誌掲載ページ: 2224-2225 p
原稿種別: 研究開発レター/英語
電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejeiss/131/12/131_12_2224/_article/-char/ja/
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