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Measuring Facial Skin Temperature Changes Caused by Mental Work-Load with Infrared Thermography

Measuring Facial Skin Temperature Changes Caused by Mental Work-Load with Infrared Thermography

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カテゴリ: 論文誌(論文単位)

グループ名: 【C】電子・情報・システム部門

発行日: 2016/11/01

タイトル(英語): Measuring Facial Skin Temperature Changes Caused by Mental Work-Load with Infrared Thermography

著者名: Tota Mizuno (Management Science and Engineering Program, The University of Electro-Communications), Takeru Sakai (Management Science and Engineering Program, The University of Electro-Communications), Shunsuke Kawazura (Management Science and Engineering

著者名(英語): Tota Mizuno (Management Science and Engineering Program, The University of Electro-Communications), Takeru Sakai (Management Science and Engineering Program, The University of Electro-Communications), Shunsuke Kawazura (Management Science and Engineering Program, The University of Electro-Communications), Hirotoshi Asano (Department of Electronics and Information Engineering, Faculty of Engineering, Kagawa University), Kota Akehi (Management Science and Engineering Program, The University of Electro-Communications), Shogo Matsuno (Management Science and Engineering Program, The University of Electro-Communications), Kazuyuki Mito (Management Science and Engineering Program, The University of Electro-Communications), Yuichiro Kume (Department of Media and Image Technology, Faculty of Engineering, Tokyo Polytechnic University), Naoaki Itakura (Management Science and Engineering Program, The University of Electro-Communications)

キーワード: Facial thermal image,Nasal skin temperature,Mental workload,Autonomic nerve activity,Periphery temperature of the lips

要約(英語): We evaluated the temperature change of facial parts as affected by mental work-load (MWL) using infrared thermography. Under MWL, autonomic nerves are active, and the skin surface temperature changes with muscular contraction. In particular, the nasal part of the face experiences the most intense change. Based on this, in previous studies MWL was evaluated by using nasal skin temperature. However, we considered whether other parts of the face experience temperature change under MWL. Therefore, in this study, to identify which other parts of the face experience temperature change, we performed an experiment to acquire facial thermal images when subjects perform a mental arithmetic calculation task. Our results indicate that, in addition to the nasal part, the temperatures around the lips and cheek might also increase under MWL.

本誌: 電気学会論文誌C(電子・情報・システム部門誌) Vol.136 No.11 (2016) 特集:電気関係学会関西連合大会

本誌掲載ページ: 1581-1585 p

原稿種別: 論文/英語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejeiss/136/11/136_1581/_article/-char/ja/

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