Midoriに対する2段階の統計的故障利用解析手法とその評価

カテゴリ: 論文誌(論文単位)

グループ名: 【C】電子・情報・システム部門

発行日: 2017/12/01

タイトル(英語): Two Stages Statistical Fault Analysis Method for Midori and its Evaluation

著者名: 野崎　佑典（名城大学 大学院 理工学研究科），池崎　良哉（名城大学 大学院 理工学研究科），吉川　雅弥（名城大学 理工学部）

著者名(英語): Yusuke Nozaki (Graduate School of Science and Technology, Meijo University), Yoshiya Ikezaki (Graduate School of Science and Technology, Meijo University), Masaya Yoshikawa (Faculty of Science and Technology, Meijo University)

キーワード: 軽量暗号，Midori，故障利用解析，耐タンパ性　　lightweight block cipher，Midori，fault analysis，tamper resistance

要約(英語): The risk of an illegal attack against the sensor devices used by the sensor network has been recently reported. Therefore, it is important that a security countermeasure by using an encryption technique. Then, lightweight block ciphers, which can realize low power, small area, and low latency, have been attracted attention as security countermeasures. Midori is a lightweight block cipher designed for the low power. Regarding the hardware security, the threat of fault analysis for a cryptographic circuit is pointed out. It is important that the tamper resistance verification of lightweight block ciphers against the fault analysis for the security of the future sensor devices. However, the fault analysis for lightweight block ciphers has barely been studied. Therefore, this study proposes a new fault analysis method for Midori. The proposed method performs the statistical analysis for the estimation of the key. Moreover, the proposed method performs two stages statistical fault analysis to analyze the all secret keys of Midori. Simulation results demonstrated the validity of the proposed method and the vulnerability of Midori against the proposed method.

本誌: 電気学会論文誌C（電子・情報・システム部門誌） Vol.137 No.12 （2017） 特集Ⅰ：電気・電子・情報関係学会東海支部連合大会　特集Ⅱ：国際会議ICESS2016

本誌掲載ページ: 1554-1561 p

原稿種別: 論文／日本語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejeiss/137/12/137_1554/_article/-char/ja/