特許識別子を用いた技術可視化分析手法に関する研究
特許識別子を用いた技術可視化分析手法に関する研究
カテゴリ: 論文誌(論文単位)
グループ名: 【C】電子・情報・システム部門
発行日: 2020/10/01
タイトル(英語): A Study on Technology Visualization Analysis Method using Patent Classifier
著者名: 柴田 正志(山口大学大学院創成科学研究科),高橋 雅和(山口大学大学院創成科学研究科)
著者名(英語): Masashi Shibata (Graduate School of Sciences and Technology for Innovation, Yamaguchi University), Masakazu Takahashi (Graduate School of Sciences and Technology for Innovation, Yamaguchi University)
キーワード: 特許分析,識別子,ネットワーク分析,技術構造抽出,グラフ,FPGA patent analyses,classifier,network analysis,technological structure extraction,graph,FPGA
要約(英語): In this paper, we propose an efficient method of technical structure analysis of FPGA development using network analysis. Recently, with the reform of the industrial structure called “Industry 4.0” and the explosive expansion of the application area of AI (Artificial Intelligence), the demand for computing power in edge devices is increasing. For these backgrounds, the acceleration by FPGA is focused on the industry. Hence, in this paper, we analyze the technology development trends of a significant FPGA supplier. As analytical data, we employ patents obtained by the company in the U.S. We focus on the classifiers in the patent information. We create graphs by classifiers and analyze their clusters. From the results of extracting graph features by the proposed method, key technology areas and their transitions are revealed in the technology development of FPGA suppliers.
本誌: 電気学会論文誌C(電子・情報・システム部門誌) Vol.140 No.10 (2020)
本誌掲載ページ: 1127-1133 p
原稿種別: 論文/日本語
電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejeiss/140/10/140_1127/_article/-char/ja/
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