機能線によるオープン系システム障害原因部位特定手法の提案

カテゴリ: 論文誌(論文単位)

グループ名: 【C】電子・情報・システム部門

発行日: 2020/10/01

タイトル(英語): Discussion of How to Reach a Root Failure Point in Open Systems Problem Using Function Chain

著者名: 篠原　昭夫（日本大学理工学部），泉　隆（日本大学理工学部）

著者名(英語): Akio Shinohara (Izumi Labs., College of Science and Technology, Nihon University), Takashi Izumi (Izumi Labs., College of Science and Technology, Nihon University)

キーワード: オープン系システム障害，障害原因調査，障害原因部位検出，機能線，補助機能線　open systems problem，root cause analysis，fault detection，function chain，auxiliary function chain

要約(英語): Discussion how to reach a root failure point in open systems problem. In most case, the analyzing process depends on the experiences of support engineers, but there is no known way for trouble shooting in such circumstance. The function chain method enables to draw down a problem visually to show the direction of analyzing process. It also provides efficient manner to drill down the problem to detail of failure point. Secondary we propose the method how to judge whether the components on the function chain have been failed or safe. It stands on to compare the log information that captured pre and post of the problem. Finally, we show the efficiency of function chain by analyzing the actual open systems problem reports. The result proofs that there is a superiority of the function chain with comparison method rather than Fault Tree Analysis. Also, it shows the function chain method reduces the number of analyzed components. There is a possibility that one function chain has multiple failure points. However, the majority of function chains have a single failure point. Therefore, in this study, we only discuss the single failure problem.

本誌: 電気学会論文誌C（電子・情報・システム部門誌） Vol.140 No.10 （2020）

本誌掲載ページ: 1156-1164 p

原稿種別: 論文／日本語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejeiss/140/10/140_1156/_article/-char/ja/