PTFEを装荷した平衡形円板共振器を用いたマイクロ波・ミリ波帯における中損失基板の厚み方向複素誘電率測定

カテゴリ: 論文誌(論文単位)

グループ名: 【C】電子・情報・システム部門

発行日: 2021/08/01

タイトル(英語): Measurement of Complex Permittivity normal to Substrates for Medium-loss Materials Using a PTFE Loaded Balanced-type Circular Disk Resonator at Microwave and Millimeter Wave Frequencies

著者名: 平山　直樹（京セラ（株）／宇都宮大学大学院工学研究科），吉川　博道（京セラ（株）），中山　明（京セラ（株）），清水　隆志（宇都宮大学大学院工学研究科），古神　義則（宇都宮大学大学院工学研究科）

著者名(英語): Naoki Hirayama (R&D Center, Kyocera Corporation/Graduate School of Engineering, Utsunomiya University), Hiromichi Yoshikawa (R&D Center, Kyocera Corporation), Akira Nakayama (R&D Center, Kyocera Corporation), Takashi Shimizu (Graduate School of Engineerin

キーワード: マイクロ波，ミリ波，複素誘電率，円板共振器，有機基板　　microwave，millimeter wave，complex permittivity，circular disk resonator，organic substrate

要約(英語): The complex permittivity normal to substrates can be measured by the balanced-type circular disk resonator method at microwave and millimeter wave frequencies. However, in the case of substrates for medium-loss materials with a dielectric loss tangent of about 10-2 and thickness of 1mm or less, the unloaded Q of the resonator decreases to about several tens, causing distortion in the resonance response. Therefore, it becomes difficult to measure the complex permittivity accurately. In this paper, we propose a polytetrafluoroethylene (PTFE) sheet loaded balanced-type circular disk resonator. By loading PTFE sheet, the distance between the conductors of the resonator is widened, and in addition, the concentration of electric field energy into the dielectric sample is weakened adequately, so that the unloaded Q of the resonator increases. The availability of this method is verified by measuring the frequency dependence of the complex permittivity of the FR4 substrate from 5 to 30 GHz.

本誌: 電気学会論文誌C（電子・情報・システム部門誌） Vol.141 No.8 （2021） 特集：Smart Cityのためのモビリティ及び通信技術

本誌掲載ページ: 842-850 p

原稿種別: 論文／日本語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejeiss/141/8/141_842/_article/-char/ja/