大容量半導体モジュールの多並列接続回路における電流検出回路の開発

カテゴリ: 論文誌(論文単位)

グループ名: 【D】産業応用部門

発行日: 2021/07/01

タイトル(英語): Current Detection Circuit in Multiple Parallel Connection Circuit of High-Power Semiconductor Modules

著者名: 加藤　美夕（東京都立大学大学院 システムデザイン研究科），長洲　正浩（茨城工業高等専門学校），鈴木　宗佑（北海道大学大学院 情報科学院），稲葉　政光（（株）日立パワーデバイス），石川　勝美（（株）日立製作所 鉄道ビジネスユニット）

著者名(英語): Miyu Katoh (Hino Campus, Tokyo Metropolitan University), Masahiro Nagasu (National Institute of Technology, Ibaraki College), Sosuke Suzuki (Graduate School of Information Science and Technology, Hokkaido University), Masamitsu Inaba (Hitachi Power Semico

キーワード: 電流検出回路，半導体モジュール，多並列接続回路　　current detection circuit，semiconductor modules，multi-parallel connection circuit

要約(英語): We are developing current-detection technology that directly measures the main current of a high-power semiconductor module using the wiring inductance of the module. In a previous study, we proposed a circuit that detects current by integrating the voltage generated in the wiring inductance between the sense emitter and emitter terminals of the IGBT (Insulated Gate Bipolar Transistor) module. In this study, we developed a total current detection scheme for parallel-connected modules.The basic principle of this scheme is that the total current can be obtained by the total of each voltage generated on the wiring inductance of each module. It was realized by using only one integrating circuit. A challenge for this study was avoiding reflection caused by impedance mismatch. We addressed this by adding a termination resistance with the same value as the characteristic impedance.

本誌: 電気学会論文誌D（産業応用部門誌） Vol.141 No.7 （2021）

本誌掲載ページ: 542-551 p

原稿種別: 論文／日本語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejias/141/7/141_542/_article/-char/ja/