Design a Continuous Switching Test Circuit for Power Devices to Evaluate Reliability

カテゴリ: 論文誌(論文単位)

グループ名: 【D】産業応用部門（英文）

発行日: 2022/01/01

タイトル(英語): Design a Continuous Switching Test Circuit for Power Devices to Evaluate Reliability

著者名: Shin-Ichiro Hayashi (Tokyo Metropolitan University), Keiji Wada (Tokyo Metropolitan University)

著者名(英語): Shin-Ichiro Hayashi (Tokyo Metropolitan University), Keiji Wada (Tokyo Metropolitan University)

キーワード: continuous switching test，long-term reliability，SiC MOSFET

要約(英語): This study presents a design method for the continuous switching test circuits of power devices. Depending on the relationship between the rated voltage of a DC voltage source and device under test (DUT), two types of test circuits are proposed. These test circuits comprise a cascaded buck-boost (or boost-buck) converter to achieve power regeneration. Based on analysis of the test circuits, a design method is proposed to ensure that any failure does not spread to the test circuit even when the DUT fails during the continuous switching tests. A test circuit is designed according to the proposed method, and its experimental results demonstrate the validity of the proposed design.

本誌: IEEJ Journal of Industry Applications Vol.11 No.1 （2022）

本誌掲載ページ: 108-116 p

原稿種別: 論文／英語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejjia/11/1/11_21004267/_article/-char/ja/