A Small and High Efficiency Circuit Topology with Significantly Improved Trade-off Between Switching Losses and dv/dt for Series Connected Devices with Regenerative Snubber Circuits

カテゴリ: 論文誌(論文単位)

グループ名: 【D】産業応用部門（英文）

発行日: 2022/11/01

タイトル(英語): A Small and High Efficiency Circuit Topology with Significantly Improved Trade-off Between Switching Losses and dv/dt for Series Connected Devices with Regenerative Snubber Circuits

著者名: Koji Maki (Infrastructure Systems R&D Center, Toshiba Infrastructure Systems & Solutions Corporation), Hiroshi Mochikawa (Infrastructure Systems R&D Center, Toshiba Infrastructure Systems & Solutions Corporation)

著者名(英語): Koji Maki (Infrastructure Systems R&D Center, Toshiba Infrastructure Systems & Solutions Corporation), Hiroshi Mochikawa (Infrastructure Systems R&D Center, Toshiba Infrastructure Systems & Solutions Corporation)

キーワード: high efficiency，low noise，regenerative snubber circuit，series connected devices

要約(英語): This paper proposes a small and high efficiency circuit topology for series connected devices with regenerative snubber circuits. The proposed circuit topology introduces an important break-through in the trade-off between switching losses and dv/dt. Regenerative snubber circuits store most of the switching losses that occur in general circuits and regenerate at high efficiency. A 10kW-200V class prototype of the proposed circuit topology recorded a maximum efficiency of 99.49%, and a rated efficiency of 99.21%. Loss analysis of the prototype demonstrated no reduction in efficiency due to the regenerative operation by regenerative snubber circuits.

本誌: IEEJ Journal of Industry Applications Vol.11 No.6 （2022）

本誌掲載ページ: 852-859 p

原稿種別: 論文／英語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejjia/11/6/11_22000380/_article/-char/ja/