内蔵LFSRを用いた乱数生成方法の評価

カテゴリ: 論文誌(論文単位)

グループ名: 【D】産業応用部門

発行日: 2023/02/01

タイトル(英語): Evaluation of a Random Number Generator based on an Internal Linear Feedback Shift Register

著者名: 鴨狩　滉斗（豊橋技術科学大学 電気・電子情報工学課程），市川　周一（豊橋技術科学大学 電気・電子情報工学系）

著者名(英語): Hiroto Kamogari (Electrical and Electronic Information Engineering Course, Toyohashi University of Technology), Shuichi Ichikawa (Department Electrical and Electronic Information Engineering, Toyohashi University of Technology)

キーワード: 乱数，URNG，TRNG，LFSR　　random number，URNG，TRNG，LFSR

要約(英語): A previous study presented a random number generator based on the fluctuation in the sampling interval of an internal linear feedback shift register (LFSR). They reported that the derived random numbers passed the Diehard test; however, the design guidelines were not specified. The previous study examined two configurations of LFSR, which are far from satisfactory to determine the appropriate length and feedback polynomial. Moreover, the minimal sampling period was not known. The present study focuses on these aspects and elucidates the requirements of LFSRs to generate high-quality random numbers. Extensive experiments were conducted, and the following results were derived. (1) The selection of the characteristic polynomial of an LFSR affects the quality of random numbers. (2) The length of an LFSR should be 48 bits or greater with a constant sampling period. (3) The sampling period should be 32 cycles or larger. (4) The quality of random number sequence is considerably improved by a fluctuating sampling period. (5) The properly designed random number generator passes the NIST test.

本誌: 電気学会論文誌D（産業応用部門誌） Vol.143 No.2 （2023） 特集：ドローンとロボット組み込み/サスティナブルシステム

本誌掲載ページ: 87-93 p

原稿種別: 論文／日本語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejias/143/2/143_87/_article/-char/ja/