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Investigation on Relationship between Common Mode Noise and Distribution of Parasitic Capacitance

Investigation on Relationship between Common Mode Noise and Distribution of Parasitic Capacitance

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カテゴリ: 論文誌(論文単位)

グループ名: 【D】産業応用部門(英文)

発行日: 2023/05/01

タイトル(英語): Investigation on Relationship between Common Mode Noise and Distribution of Parasitic Capacitance

著者名: Mamoru Sasaki (Graduate School of Engineering, Nagoya University), Jun Imaoka (Institute of Materials and Systems for Sustainability, Nagoya University), Masayoshi Yamamoto (Institute of Materials and Systems for Sustainability, Nagoya University)

著者名(英語): Mamoru Sasaki (Graduate School of Engineering, Nagoya University), Jun Imaoka (Institute of Materials and Systems for Sustainability, Nagoya University), Masayoshi Yamamoto (Institute of Materials and Systems for Sustainability, Nagoya University)

キーワード: EMI,common mode noise,parasitic capacitance

要約(英語): This study investigates the influence of parasitic capacitance on the common mode (CM) noise in a converter. A thermal pad on a switching device is necessary for sufficient heat dissipation. In addition, the thermal pad increases the CM capacitance between the printed circuit board and the ground plane. The parasitic capacitances form CM noise propagation paths. However, which node in the circuit and the corresponding parasitic capacitance influences the CM noise the most and the degree of the parasitic capacitance influence on the CM noise are unclear. In this study, the parasitic capacitance that influences the CM noise in a converter is identified, and the extent to which the parasitic capacitance affects the CM noise is investigated through simulations and experiments.

本誌: IEEJ Journal of Industry Applications Vol.12 No.3 (2023) Special Issue on “IPEC-Himeji 2022”

本誌掲載ページ: 484-492 p

原稿種別: 論文/英語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejjia/12/3/12_22008018/_article/-char/ja/

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