Four-Terminal Electrical Measurement of a DNA Molecular Bundle Captured by Silicon Nanotweezers

カテゴリ: 論文誌(論文単位)

グループ名: 【E】センサ・マイクロマシン部門

発行日: 2013/03/01

タイトル(英語): Four-Terminal Electrical Measurement of a DNA Molecular Bundle Captured by Silicon Nanotweezers

著者名: Masataka Usami (CIRMM, Institute of Industrial Science, The University of Tokyo), Tadashi Ishida (CIRMM, Institute of Industrial Science, The University of Tokyo), Momoko Kumemura (CIRMM, Institute of Industrial Science, The University of Tokyo), Laurent

著者名(英語): Masataka Usami (CIRMM, Institute of Industrial Science, The University of Tokyo), Tadashi Ishida (CIRMM, Institute of Industrial Science, The University of Tokyo), Momoko Kumemura (CIRMM, Institute of Industrial Science, The University of Tokyo), Laurent Jalabert (LIMMS/CNRS-IIS (UMI2820), The University of Tokyo), Dominique Collard (LIMMS/CNRS-IIS (UMI2820), The University of Tokyo), Hiroyuki Fujita (CIRMM, Institute of Industrial Science, The University of Tokyo)

キーワード: microtweezers，DNA，dielectrophoresis，electrical measurement，four-terminal measurement

要約(英語): We measured the electrical characteristics of DNA molecular bundles that were 25-μm long and had a diameter of 100-500 nm. We captured the bundle between the tips of silicon nanotweezers by dielectrophoresis. The two-terminal measurement, which used only the tweezers, failed because of the contact resistance between the bundle and the tips. We adopted a four-terminal measurement that eliminated the effect of the contact resistance. We fabricated potential measurement probes, which consisted of 2μm-wide line electrodes with a 4μm separation. The captured DNA bundle was pressed against the probes, and the potential drop associated with the current in the bundle was measured. We successfully determined the conductivity of the bundle.

本誌: 電気学会論文誌E（センサ・マイクロマシン部門誌） Vol.133 No.3 （2013） 特集：センサ・マイクロマシン英文特集号

本誌掲載ページ: 98-99 p

原稿種別: 研究開発レター／英語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejsmas/133/3/133_98/_article/-char/ja/