Applications of the Extended Weibull Distribution to Reliability Analysis

カテゴリ: 全国大会

論文No: 3-033

グループ名: 【全国大会】平成12年電気学会全国大会論文集

発行日: 2000/03/21

タイトル(英語): Applications of the Extended Weibull Distribution to Reliability Analysis

著者名: 廣瀬 英雄(九州工業大学),信岡 吾郎(九州工業大学),小守 良雄(九州工業大学)

著者名(英語): Hideo Hirose(Kyushu Institute of Technology),Gorou Nobuoka(Kyushu Institute of Technology),Yoshio Komori(Kyushu Institute of Technology)

キーワード: 絶縁破壊電圧|最尤法|寿命|拡張ワイブル

要約(日本語): The extended exponential and Weibull distribution proposed by Marshall and Olkin (1997)can certainly be competitors to the conventional distribution modelsin the sense of the likelihood principle. This paper illustrates how much more accuratethe extended models are than the conventional models in some sampled data cases, whichsuggests recommending of use of the extended models.

原稿種別: 日本語

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