Effect of Amplitude on Signal's Phase during Inspection of Printed Circuit Board by Eddy-Current Testing Probe

カテゴリ: 全国大会

論文No: 3-176

グループ名: 【全国大会】平成12年電気学会全国大会論文集

発行日: 2000/03/21

タイトル(英語): Effect of Amplitude on Signal's Phase during Inspection of Printed Circuit Board by Eddy-Current Testing Probe

著者名: Dariusz Kacprzak(金沢大学),山田 外史(金沢大学),岩原 正吉(金沢大学),Subhas C. Mukhopadhyay (金沢大学)

著者名(英語): Dariusz Kacprzak(Kanazawa University),Sotoshi Yamada(Kanazawa University),Masayoshi Iwahara(Kanazawa University),Subhas C. Mukhopadhyay (Kanazawa University)

要約(日本語): This paper presents a principle of phase behavior during inspection of PCB by ECT method. Output signals deliver information about defects, soldering points and geometry of conductors. These signals differ from one another by amplitude. Setting proper thresholds can provide their separation. However a phase of output signals is also changeable. A characteristic obtained from these changes has a unique shape. Its signals differ not only by amplitude, but also by shape, therefore interpretation of signals can be much easier.

原稿種別: 日本語

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