Analysis of Surface Degradation Layer on Silicone Rubber
Analysis of Surface Degradation Layer on Silicone Rubber
カテゴリ: 全国大会
論文No: 2-035
グループ名: 【全国大会】令和5年電気学会全国大会論文集
発行日: 2023/03/01
タイトル(英語): Analysis of Surface Degradation Layer on Silicone Rubber
著者名: KhaingMay Thin(University of Miyazaki),YoshimuraKosei(University of Miyazaki),SakodaTatsuya(University of Miyazaki),GotoShigehiko(Toshiba Energy Systems & Solutions),AnjikiTomikazu(Toshiba Energy Systems & Solutions),ChibaTomoki(Toshiba Energy Sys
著者名(英語): May Thin Khaing (University of Miyazaki),Kosei Yoshimura (University of Miyazaki),Tatsuya Sakoda (University of Miyazaki),Shigehiko Goto (Toshiba Energy Systems & Solutions),Tomikazu Anjiki (Toshiba Energy Systems & Solutions),Tomoki Chiba (Toshib
キーワード: |silicone rubber|surface degradation|ATR-FTIR|SEM
要約(英語): To investigate the degradation characteristics owing to the natural factors, it is necessary to collect a lot of aged specimens. However, it is difficult to collect aged SiR insulators used for more than several decades. Therefore, we tried to fabricate a
本誌掲載ページ: 37-38 p
原稿種別: 英語
PDFファイルサイズ: 361 Kバイト
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