トムソン散乱法による金属蒸気混入アーク放電プラズマの電子密度・電子温度計測
トムソン散乱法による金属蒸気混入アーク放電プラズマの電子密度・電子温度計測
カテゴリ: 論文誌(論文単位)
グループ名: 【A】基礎・材料・共通部門
発行日: 2013/09/01
タイトル(英語): Measurements of Electron Density and Electron Temperature of Arc Discharge Plasmas Containing Metallic Vapors using Laser Thomson Scattering
著者名: 富田 健太郎(九州大学大学院総合理工学研究院),吉武 真称(九州大学大学院総合理工学研究院),内野 喜一郎(九州大学大学院総合理工学研究院),竹中 大悟(九州工業大学),戸田 弘明(九州工業大学),匹田 政幸(九州工業大学),鈴木 克巳((株) 東芝)
著者名(英語): Kentaro Tomita (Interdisciplinary Graduate School of Engineering Sciences, Kyushu University), Shinya Yoshitake (Interdisciplinary Graduate School of Engineering Sciences, Kyushu University), Kiichiro Uchino (Interdisciplinary Graduate School of Engineering Sciences, Kyushu University), Daigo Takenaka (Kyushu Institute of Technology), Hiroaki Toda (Kyushu Institute of Technology), Masayuki Hikita (Kyushu Institute of Technology), Katsumi Suzuki (Toshiba Corporation)
キーワード: トムソン散乱,ガス遮断器,アーク放電,電子密度,電子温度,金属蒸気 Thomson scattering,gas circuit breaker,arc discharge,electron density,electron temperature,metallic vapor
要約(英語): Laser Thomson scattering (LTS) has been applied to arc discharges generated in the atmospheric air to measure electron density (ne) and electron temperature (Te). As electrode materials, tungsten and tungsten-copper (30%) were used. The electrode gap was 0.8mm and its diameter was 1mm. The applied voltage was 6kV, the peak current was 600A and the decay time of the voltage and the current was 25μs. Spatiotemporal evolutions of ne and Te were measured at 10μs, 30μs and 50μs after the discharge initiation. At these times, obtained values of ne and Te were estimated to be in the ranges of (0.8-2.0)×1023m-3 and 1.0-2.2eV, respectively. These values were consistent with those evaluated from Saha's thermodynamic equation at 1 atm. It was also found that the decay of the arc discharge produced using the tungsten-copper electrodes was much faster than that produced using the tungsten electrodes.
本誌: 電気学会論文誌A(基礎・材料・共通部門誌) Vol.133 No.9 (2013)
本誌掲載ページ: 458-464 p
原稿種別: 論文/日本語
電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejfms/133/9/133_458/_article/-char/ja/
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