赤外線カメラによる太陽電池モジュールのバイパス回路の開放故障検出技術―日射強度の故障検出への影響―

カテゴリ: 論文誌(論文単位)

グループ名: 【B】電力・エネルギー部門

発行日: 2020/03/01

タイトル(英語): Open Fault Detection Technology of Bypass Circuit of PV Module with IR Camera―Effect of Irradiance on Fault Detection―

著者名: 藤田　直希（日本大学 理工学部），西川　省吾（日本大学 理工学部），山田　竜也（（株）チノー），寺田　大亮（（株）チノー），瀧川　隆介（（株）チノー）

著者名(英語): Naoki Fujita (College of Science and Technology, Nihon University), Shogo Nishikawa (College of Science and Technology, Nihon University), Ryuya Yamada (CHINO Corporation), Daisuke Terada (CHINO Corporation), Ryusuke Takigawa (CHINO Corporation)

キーワード: 太陽電池モジュール，バイパス回路，開放故障，赤外線カメラ，温度変化，周波数解析　　PV module，bypass circuit，open fault，IR camera，temperature change，frequency analysis

要約(英語): When the bypass circuit of the PV module is open and the performance of solar cell drops by partial shadow, abnormality and so on, a part of solar cells generates heat and becomes a hotspot. In the worst case, since this malfunction is likely to lead to the fire, early detection is important. The technology proposed in this paper is intentionally to increase the temperature of the faulty part of PV module by applying an AC voltage with a power source. The temperature change is observed with an IR camera, and the fault point is identified by the frequency analysis to avoid the disturbance such as surrounding building and so on. In this paper, we describe the principle of detection technology and the effect of irradiance.

本誌: 電気学会論文誌B（電力・エネルギー部門誌） Vol.140 No.3 （2020） 特集：未来社会創造に向けた超電導バルク材の挑戦

本誌掲載ページ: 210-218 p

原稿種別: 論文／日本語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejpes/140/3/140_210/_article/-char/ja/