フェムト秒時間分解電子顕微鏡の研究

カテゴリ: 論文誌(論文単位)

グループ名: 【C】電子・情報・システム部門

発行日: 2014/04/01

タイトル(英語): Femtosecond Time-resolved Electron Microscopy

著者名: 楊　金峰（大阪大学産業科学研究所），吉田　陽一（大阪大学産業科学研究所），柴田　裕実（大阪大学産業科学研究所）

著者名(英語): Jinfeng Yang (The Institute of Scientific and Industrial Research (ISIR), Osaka University), Yoichi Yoshida (The Institute of Scientific and Industrial Research (ISIR), Osaka University), Hiromi Shibata (The Institute of Scientific and Industrial Research (ISIR), Osaka University)

キーワード: 時間分解電子顕微鏡，透過型電子顕微鏡，フェムト秒電子イメージング，高周波電子銃　　Time-resolved electron microscopy，TEM，femtosecond electron imaging，radio-frequency electron gun

要約(英語): The revealing and understanding of ultrafast structural-change induced dynamics are essential not only in physics, chemistry and biology, but also are indispensable for the development of new materials, new devices and applications. A new radio-frequency electron gun based ultrafast relativistic electron microscopy (UEM) has being developed in Osaka University to probe directly structural changes at the atomic scale with sub-100 fs temporal resolution in materials. The first prototype of femtosecond time-resolved relativistic-energy UEM has been constructed at end of October in 2012. Both relativistic-energy electron diffraction and image measurements have been succeeded using a femtosecond electron beam. In this paper, the development of the UEM prototype and the first experiments of relativistic-energy electron imaging were reported.

本誌: 電気学会論文誌C（電子・情報・システム部門誌） Vol.134 No.4 （2014） 特集：量子ビームによるナノバイオ物理応用技術

本誌掲載ページ: 515-520 p

原稿種別: 論文／日本語

電子版へのリンク: https://www.jstage.jst.go.jp/article/ieejeiss/134/4/134_515/_article/-char/ja/